OML552 Microscopy Syllabus:

OML552 Microscopy Syllabus – Anna University Regulation 2017

OBJECTIVES:

• This course will cover the basic principles and techniques of optical and electron microscopy.
• This course also deals with the sample preparation techniques for the microstructural analysis.

UNIT I INTRODUCTION

History of Microscopy, Overview of current microscopy techniques. Light as particles and waves, Fundamental of optics: Diffraction and interference in image formation, real and virtual images, Resolution, Depth of field and focus, Magnification, Numerical aperture, Aberration of lenses. Components of Light Microscopy, Compound light microscopy and its variations.

UNIT II MICROSCOPY

Phase contrast microscopy: optical design, theory, image interpretation, Dark-field microscopy: optical design, theory, image interpretation, Polarization Microscopy: Polarized light, optical design, theory, image interpretation, Differential Interference Contrast (DIC): equipment and optics, image interpretation, Modulation contrast microscopy: contrast methods using oblique illumination.

UNIT III ELECTRON MICROSCOPY

Interaction of electrons with matter, elastic and inelastic scattering, secondary effects, Components of electron microscopy: Electron sources, pumps and holders, lenses, apertures, and resolution. Scanning Electron and Transmission Electron Microscopy: Principle, construction, applications and limitations.

UNIT IV SAMPLE PREPARATION FOR MICROSTRUCTURAL ANALYSIS

Optical Microscopy sample preparation: Grinding, polishing and etching, SEM sample preparation: size constrains, TEM sample preparation: Disk preparation, electro polishing, ion milling, lithography, storing specimens.

UNIT V CHEMICAL ANALYSIS

Surface chemical composition (Principle and applications) – Mass spectroscopy and X-ray emission spectroscopy – Energy Dispersive Spectroscopy- Wave Dispersive Spectroscopy. Electron spectroscopy for chemical analysis (ESCA), Ultraviolet Photo Electron Spectroscopy (UPS), X ray Photoelectron Spectroscopy (XPS), Auger Electron Spectroscopy (AES)- Applications.

TEXT BOOKS:

1. Douglas B. Murphy, Fundamentals of light microscopy and electronic imaging, 2001, WileyLiss, Inc. USA
2. David B. Williams and C. Barry Carter, Transmission Electron Microscopy-A Textbook for Materials Science, Springer US, 2nd edition, 2009.

REFERENCES:

1. Brandon D. G, “Modern Techniques in Metallography”, Von Nostrand Inc. NJ, USA, 1986.
2. Whan R E (Ed), ASM Handbook, Volume 10, Materials Characterization “, Nineth Edition, ASM international, USA, 1986.
3. Thomas G., “Transmission electron microscopy of metals”, John Wiley, 1996.