MR4001 Computer Aided Inspection Syllabus:

MR4001 Computer Aided Inspection Syllabus – Anna University PG Syllabus Regulation 2021

COURSE OBJECTIVES:

1. To familiar the measurement standards and to know the instruments used and various errors in measurements
2. To recognize the use of basic and advanced instruments for measurements.
3. To learn the applications of opto-electronics device for measurements.
4. To observe the machine vision-based inspections.
5. To acquire the measurement strategies in inspection using CMM.

UNIT I FUNDAMENTALS AND CONCEPTS IN METROLOGY

Standards of measurement – Analog and digital measuring instruments-comparators – Limits, Fits and Tolerances – Gauge design – Angular measurements – Surface Roughness – Form errors and measurements.

UNIT II INSPECTION AND GENERAL MEASUREMENTS

Inspection of gears and threads – Tool makers’ microscope – Universal measuring machine – use of Laser interferometer in machine tool Inspection – use of laser in on-line Inspection – Laser micrometer – Laser Alignment telescope.

UNIT III OPTO ELECTRONICS IN ENGINEERING INSPECTION

Use of opto electronics in Tool wear measurement – Micro hole measurement and surface Roughness – Applications in In-Process measurement and on line Inspection.

UNIT IV MACHINE VISION

Fundamentals of Image Processing – Steps involved in Image Processing – Machine Vision applications in manufacturing and metrology.

UNIT V COORDINATE METROLOGY AND QUALITY CONTROL

Co-ordinate measuring machines – Applications and case-studies of CMM in Inspection – Use of Computers in quality control – Control charts – Reliability.

TOTAL : 45 PERIODS

COURSE OUTCOMES:

At the end of the course, students will be able to
Upon completion of this course, the students will be able to:
CO1: Evaluate the standards in measurements and to avoid the various forms of errors in measurements.
CO2: Apply of basic and advanced metrology instruments for measurements.
CO3: Acquire the knowledge on non-contact opto-electronics device for measurements.
CO4: Apply machine vision-based inspections.
CO5: Create the measurement strategies in inspection using CMM

REFERENCES

1. Anil.K.Jain, “Fundamentals of Digital Image Processing”, Prentice Hall of India Pvt. Ltd., 2015.
2. Dale.H. Besterfield, “Total Quality Management”, Pearson Education Asia, 2018.
3. Jain R.K., “Engineering Metrology”, Khanna Publishers, 2018.
4. Manuals of C.M.M. and Systems.
5. Robert G. Seippel, “Opto Electronics for technology and engineering”, Prentice Hall, New Jersey, 1989.