CM4201 Advanced Metrology Syllabus:
CM4201 Advanced Metrology Syllabus – Anna University PG Syllabus Regulation 2021
COURSE OBJECTIVES:
To teach the concepts of metrology.
To train the students in various aspects of measurement of surface roughness.
To train the students in the area of interferometry and form measurements.
To train the students with understanding the fundamental principles of computer aided inspection and laser metrology.
To introduce the basic principles of image processing and machine vision in context to metrological applications.
UNIT I CONCEPTS OF METROLOGY
Introduction – Terminologies – Standards of measurement – Interchangeability – Selective assembly – Accuracy and Precision – Calibration of instruments – Errors in measurements – Laboratory accreditation, Basics of dimensional metrology and Form metrology – Clean room – Maintenance and handling of metrology equipment’s – Standard practices of inspection rooms.
UNIT II MEASUREMENT OF SURFACE ROUGHNESS
Introduction – Types of Surface Texture – Surface Roughness Measurement Methods – Roughness parameters, bearing area parameters, Contact and Non-Contact type roughness measuring instruments, 3D Surface Roughness Measurement – Nano Level Surface Roughness Measurement – Instruments: Scanning Electron Microscope(SEM), Transmission Electron Microscope(TEM), Scanning and Transmission Electron Microscope(STEM), Atomic Force Microscopy(AFM).
UNIT III INTERFEROMETRY
Introduction – Principles of Interferometry – Optical flats in assessing surface contours – Interferometers – Measurement and Calibration – Laser Interferometry – Engineering applications of interferometry.
UNIT IV COMPUTER AIDED INSPECTION AND LASER METROLOGY
Introduction – Computer Aided Inspection Techniques – Tool Makers Microscope – Coordinate Measuring Machines – Applications – Advanced Laser gauging techniques – Lasers in precision Measurements – Laser Scanners for Reverse Engineering – In-process inspection -Industrial case studies.
UNIT V MACHINE VISION AND IMAGE PROCESSING
Introduction – Machine vision – Overview – Computer imaging systems, Image Analysis, Preprocessing, Human Vision System, Image model, Image enhancement, gray scale models, histogram models, Image Transforms – Applications of image processing -Advantages and limitations and Case studies
COURSE OUTCOMES:
At the end of this course, the students shall be able to:
CO1: Illustrate the fundamental concepts of measurement, standards, calibration, maintenance of laboratory facilities and handling of metrological equipments.
CO2: Explain the roughness and its applications in manufacturing research, learn the important concepts, principles and applications related to interferometry.
CO3: Justify the use of interferometry related sophisticated measurement and inspection facilities.
CO4: Relate the concepts of Computer aided inspection technologies for industrial Situations, design and develop new inspection techniques.
CO5: Discuss the importance of image processing techniques and the possibilities of developing new heuristics for image processing related to metrology.
REFERENCES:
1. “ASTE Handbook of Industries Metrology”, Prentice Hall of India Ltd., India,1992.
2. Bewoor A.K. and Kulkarni V.A.,”Metrology and Measurement”, Tata McGraw-Hill, India, 2009.
3. Galyer F.W. and Shotbolt C.R., “Metrology for engineers”, ELBS, Germany, 1990.
4. Jain R.K., “Engineering Metrology”, Khanna Publishers, India, 2008.
5. Smith G.T., “Industrial Metrology”, Springer, United States, 2002.