NT4201 Imaging Techniques for Nanotechnology Syllabus:
NT4201 Imaging Techniques for Nanotechnology Syllabus – Anna University PG Syllabus Regulation 2021
OBJECTIVE
This course introduces the student to the most important techniques available for micro and nano- materials characterization necessary for the development of micro- and nano- manufacturing
UNIT I OPTICAL MICROSCOPY
Concept of resolution and depth of field/focus in imaging, types of aberrations (spherical, chromatic, diffraction and astigmatism), Optical microscopy (OM) – reflected/transmitted light microscopy, theoretical and practical resolution of an optical microscope, numerical aperture, principles of image formation, dark field, polarized light and phase contrast microscopy and applications of each in metallurgical and materials engineering, sample preparation for optical microscopy and limitations.
UNIT II SCANNING ELECTRON MICROSCOPY
Advantages/disadvantages as compared to OM and other imaging techniques, mechanics of SEM, types of electron gun and comparison between them (in terms of resolution, brightness, efficiency and applications), SEM, its working and construction, concept of magnification as applied to SEM, electron-matter interaction, imaging modes (secondary and backscattered), effect of spot size, apertures, accelerating voltage on SEM imaging, signal detection (by using Everhart- Thornley, Robinson and solid state detectors), atomic number and topological contrast, critical probe current, chemical analysis of phases using SEM (EDS).
UNIT III TRANSMISSION ELECTRON MICROSCOPY
Principles of transmission electron microscopy – Modes of operation – construction, ray-diagram, working, sample preparation – contrast mechanisms (mass-thickness, phase and diffraction contrast), imaging modes, Diffraction in imperfect crystals – HRTEM use in nanostructures.
UNIT IV ATOMIC FORCE MICROSCOPY
Basic concepts-Interaction force-AFM and the optical lever- AFM tip on nanometer scale structures- force curves, measurements and manipulations-feedback control-different modes of operation –contact, non contact and tapping mode-Imaging and manipulation of samples in air or liquid environments-Imaging soft samples. Scanning Force Microscopy-types -Magnetic Force microscopy.
UNIT V SCANNING TUNNELING MICROSCOPY
Principle- Instrumentation- importance of STM for surface and molecular manipulation, 3D map of electronic structure.
TOTAL : 45 PERIODS
COURSE OUTCOMES:
CO1: Upon completion of the course, the students will be able to: – describe fundamental principles of operation of four materials characterization techniques, namely optical microscopy, scanning electron microscopy, transmission electron microscopy and scanning probe microscopy
CO2: Explain the production of x-rays, electrons and the electron-specimen interaction mechanisms
CO3: Select appropriate characterization methods to the analysis and characterization of materials and apply the microstructural characterization techniques to the analysis of materials at the micro and nano-scale
REFERENCES
1. J. Goldstein, D. Newbury, D. Joy, C. Lyman, P. Echlin, E. Lifshin, L. Sawyer and J. Michael, “Scanning Electron Microscopy and X-ray Microanalysis” 3rd Edition, Springer Science, Berlin 2003.
2. Ray Egerton: “Physical Principles of Electron Microscopy” Springer Science, Berlin, 2005.
3. D. Brandon and W. Kaplan: “Microstructural Characterization of Materials”, John Wiley and Sons, London, 2008.
4. Douglas B. Murphy : “Fundamentals Of Light Microscopy And Electronic Imaging”, John Wiley and Sons, London, 2001